基于Simulink-COMSOL的IGBT结温计算方法A junction temperature calculation method for IGBT based on Simulink-COMSOL
徐睿晨,王立勇,李乐,吴健鹏,张喜明
摘要(Abstract):
为准确分析绝缘栅双极型晶体管(insulated gate bipolar transistor, IGBT)运行时的温升特性,提出一种基于Simulink-COMSOL的IGBT结温计算方法。在Simulink中构建三相电流-器件导通时序的动态损耗模型,将损耗结果作为空间热源导入COMSOL进行三维瞬态温度场求解。以斯达半导体的GD1400HFX170P2S模块为例构建结温仿真模型,同时搭建稳态导通实验电路模拟模块工作时的发热情况,开展温升试验,分析模块上桥臂和下桥臂单个芯片的温升规律。仿真和试验结果表明,所提仿真模型与试验结果在不同输入电流下的最大温度误差在2.7%以内,验证了该计算方法的有效性。
关键词(KeyWords): 绝缘栅双极型晶体管(insulated gate bipolar transistor, IGBT)模块;结温计算;温升试验;有限元分析法
基金项目(Foundation):
作者(Author): 徐睿晨,王立勇,李乐,吴健鹏,张喜明
DOI: 10.16508/j.cnki.11-5866/n.2026.02.011
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